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台湾讯利L5610测试系统
L5610 tester system
L5610 of IC tester, fit to consumer IC, embedded memory
IC, etc.., was developed with low cost and high performance.
It has been nicely performing since top 1999 by customer,
including Winbond, Sunplus, and EMC etc. L5610 afforded
table-programming method, matched with easy software
and simple hardware, to meet application of different
products. SSE sincerely promote L5160 to be a well-competitive
and low price.
Features:
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10MHz
data rate |
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256
channels |
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TG
per pin resource |
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Level
per pin |
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4
PMU & 4 DPS |
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ALPG
function |
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64
Timing Set |
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1M
pattern memory for logic pattern |
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128K
pattern memory for ALPG |
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A
DBM with 4M x 32bits |
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Fail
Memory for fail analysis |
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TTL
and GPIB interface |
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