|
|
|
|
| System
outline |
Test
frequency |
10
MHz |
| Overall
timing accuracy |
<
10 nS |
| Number
of pins |
128
I/O |
| Parallel
measurement capability |
2
DUTs |
| OS/Language
|
DOS
/ C++ |
| Data
failure memory |
64
KW / PIN |
| Driver
specifications
|
Driver
output level |
-2V~+11V
|
| Level
selection |
4
Levels |
| Timing
resolution |
1ns
|
|
Comparator
specifications |
Input
voltage |
-10.0V~+10.0V
|
| Input
impedance |
>10MΩ
|
| Level
(Voh / Vol)selection |
2
LEVELS |
| Input
capacitance |
<50pF
|
| Timing
resolution |
1ns
|
| Dynamic
load
|
Level(IOH/IOL)
selection |
2
levels |
| Output
current |
IOH:
-1mA to –25 mA
IOL:
1mA to 25mA
|
| Device
power supply
|
Output
voltage |
-40V
to 40V -8V to 8V -4V to 4V |
| Measured
current |
-400mA
to 400mA |
| Number
of units |
4
|
| Force
voltage measure current (FVMI) |
Voltage
range of setting |
4V
/ 8V / 40V |
| |
Voltage
resolution |
122uV
/ 244uV / 1.22mV |
| Current
source voltage measurement (ISVM)
|
Force
current range |
±5uA/50uA/500uA/5mA/50mA/500mA |
| Current
resolution |
122pA/1.22nA/12.2nA/122nA/1.22
uA /12.2uA |
| Voltage
measurement range |
4V
/ 8V / 40 V |
| Voltage
resolution |
122uV
/ 244uV / 977uV |
|
Time
measure unit |
Period
measurement range |
100nS
~ 3.0 sec |
| Resolution
|
20nS
or 200nS |
